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Optimal randomness certification from one entangled bit
University of Borås, Faculty of Librarianship, Information, Education and IT.ORCID iD: 0000-0002-1539-8256
2016 (English)In: Physical Review A. Atomic, Molecular, and Optical Physics, ISSN 1050-2947, E-ISSN 1094-1622, Vol. 93, no 4Article in journal (Refereed) Accepted
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Abstract [en]

By performing local projective measurements on a two-qubit entangled state one can certify in a device-independent way up to one bit of randomness. We show here that general measurements, defined by positive-operator-valued measures, can certify up to two bits of randomness, which is the optimal amount of randomness that can be certified from an entangled bit. General measurements thus provide an advantage over projective ones for device-independent randomness certification.

Place, publisher, year, edition, pages
2016. Vol. 93, no 4
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Subatomic Physics
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URN: urn:nbn:se:hb:diva-8535DOI: 10.1103/PhysRevA.93.040102ISI: 000374519400001Scopus ID: 84964330992OAI: oai:DiVA.org:hb-8535DiVA: diva2:894337
Available from: 2016-01-14 Created: 2016-01-14 Last updated: 2017-11-30Bibliographically approved

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Wittek, Peter

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